- Electrical and Electronic Engineering - Research Publications
Electrical and Electronic Engineering - Research Publications
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ItemSilicon nanowire photodetector enhanced by a bow-tie antennaFelic, GK ; Al-Dirini, F ; Hossain, FM ; Thanh, CN ; Skafidas, E (SPRINGER, 2014-05)
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ItemAll-Graphene Planar Self-Switching MISFEDs, Metal-Insulator-Semiconductor Field-Effect DiodesAl-Dirini, F ; Hossain, FM ; Nirmalathas, A ; Skafidas, E (NATURE PORTFOLIO, 2014-02-05)Graphene normally behaves as a semimetal because it lacks a bandgap, but when it is patterned into nanoribbons a bandgap can be introduced. By varying the width of these nanoribbons this band gap can be tuned from semiconducting to metallic. This property allows metallic and semiconducting regions within a single Graphene monolayer, which can be used in realising two-dimensional (2D) planar Metal-Insulator-Semiconductor field effect devices. Based on this concept, we present a new class of nano-scale planar devices named Graphene Self-Switching MISFEDs (Metal-Insulator-Semiconductor Field-Effect Diodes), in which Graphene is used as the metal and the semiconductor concurrently. The presented devices exhibit excellent current-voltage characteristics while occupying an ultra-small area with sub-10 nm dimensions and an ultimate thinness of a single atom. Quantum mechanical simulation results, based on the Extended Huckel method and Nonequilibrium Green's Function Formalism, show that a Graphene Self-Switching MISFED with a channel as short as 5 nm can achieve forward-to-reverse current rectification ratios exceeding 5000.
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ItemModeling of grain boundary barrier modulation in ZnO invisible thin film transistorsHossain, FM ; Nishii, J ; Takagi, S ; Sugihara, T ; Ohtomo, A ; Fukumura, T ; Koinuma, H ; Ohno, H ; Kawasaki, M (ELSEVIER SCIENCE BV, 2004-03)
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ItemHigh mobility thin film transistors with transparent ZnO channelsNishii, J ; Hossain, FM ; Takagi, S ; Aita, T ; Saikusa, K ; Ohmaki, Y ; Ohkubo, I ; Kishimoto, S ; Ohtomo, A ; Fukumura, T ; Matsukura, F ; Ohno, Y ; Koinuma, H ; Ohno, H ; Kawasaki, M (JAPAN SOC APPLIED PHYSICS, 2003-04-01)We have fabricated high performance ZnO thin film transistors (TFTs) using CaHfOxbuffer layer between ZnO channel and amorphous silicon–nitride gate insulator. The TFT structure, dimensions, and materials set are identical to those of the commercial amorphous silicon (a-Si) TFTs in active matrix liquid crystal display, except for the channel and buffer layers replacing a-Si. The field effect mobility can be as high as 7 cm2·V-1·s-1for devices with maximum process temperature of 300°C. The process temperature can be reduced to 150°C without much degrading the performance, showing the possibility of the use of polymer substrate.