Improved Application of Carbon Nanotube Atomic Force Microscopy Probes Using PeakForce Tapping Mode
AuthorSlattery, AD; Shearer, CJ; Shapter, JG; Blanch, AJ; Quinton, JS; Gibson, CT
University of Melbourne Author/sBlanch, Adam
AffiliationAnatomy and Neuroscience
Document TypeJournal Article
CitationsSlattery, A. D., Shearer, C. J., Shapter, J. G., Blanch, A. J., Quinton, J. S. & Gibson, C. T. (2018). Improved Application of Carbon Nanotube Atomic Force Microscopy Probes Using PeakForce Tapping Mode. NANOMATERIALS, 8 (10), https://doi.org/10.3390/nano8100807.
Access StatusOpen Access
In this work PeakForce tapping (PFT) imaging was demonstrated with carbon nanotube atomic force microscopy (CNT-AFM) probes; this imaging mode shows great promise for providing simple, stable imaging with CNT-AFM probes, which can be difficult to apply. The PFT mode is used with CNT-AFM probes to demonstrate high resolution imaging on samples with features in the nanometre range, including a Nioprobe calibration sample and gold nanoparticles on silicon, in order to demonstrate the modes imaging effectiveness, and to also aid in determining the diameter of very thin CNT-AFM probes. In addition to stable operation, the PFT mode is shown to eliminate "ringing" artefacts that often affect CNT-AFM probes in tapping mode near steep vertical step edges. This will allow for the characterization of high aspect ratio structures using CNT-AFM probes, an exercise which has previously been challenging with the standard tapping mode.
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