Post-sample aperture for low background diffraction experiments at X-ray free-electron lasers

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Wiedorn, MO; Awel, S; Morgan, AJ; Barthelmess, M; Bean, R; Beyerlein, KR; Chavas, LMG; Eckerskorn, N; Fleckenstein, H; Heymann, M; ...Date
2017-11-01Source Title
Journal of Synchrotron RadiationPublisher
INT UNION CRYSTALLOGRAPHYUniversity of Melbourne Author/s
Morgan, AndrewAffiliation
School of PhysicsMetadata
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Journal ArticleCitations
Wiedorn, M. O., Awel, S., Morgan, A. J., Barthelmess, M., Bean, R., Beyerlein, K. R., Chavas, L. M. G., Eckerskorn, N., Fleckenstein, H., Heymann, M., Horke, D. A., Knoska, J., Mariani, V., Oberthuer, D., Roth, N., Yefanov, O., Barty, A., Bajt, S., Kuepper, J. ,... Chapman, H. N. (2017). Post-sample aperture for low background diffraction experiments at X-ray free-electron lasers. JOURNAL OF SYNCHROTRON RADIATION, 24 (Pt 6), pp.1296-1298. https://doi.org/10.1107/S1600577517011961.Access Status
Open AccessAbstract
The success of diffraction experiments from weakly scattering samples strongly depends on achieving an optimal signal-to-noise ratio. This is particularly important in single-particle imaging experiments where diffraction signals are typically very weak and the experiments are often accompanied by significant background scattering. A simple way to tremendously reduce background scattering by placing an aperture downstream of the sample has been developed and its application in a single-particle X-ray imaging experiment at FLASH is demonstrated. Using the concept of a post-sample aperture it was possible to reduce the background scattering levels by two orders of magnitude.
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