Post-sample aperture for low background diffraction experiments at X-ray free-electron lasers
AuthorWiedorn, MO; Awel, S; Morgan, AJ; Barthelmess, M; Bean, R; Beyerlein, KR; Chavas, LMG; Eckerskorn, N; Fleckenstein, H; Heymann, M; ...
Source TitleJournal of Synchrotron Radiation
PublisherINT UNION CRYSTALLOGRAPHY
University of Melbourne Author/sMorgan, Andrew
AffiliationSchool of Physics
Document TypeJournal Article
CitationsWiedorn, M. O., Awel, S., Morgan, A. J., Barthelmess, M., Bean, R., Beyerlein, K. R., Chavas, L. M. G., Eckerskorn, N., Fleckenstein, H., Heymann, M., Horke, D. A., Knoska, J., Mariani, V., Oberthuer, D., Roth, N., Yefanov, O., Barty, A., Bajt, S., Kuepper, J. ,... Chapman, H. N. (2017). Post-sample aperture for low background diffraction experiments at X-ray free-electron lasers. JOURNAL OF SYNCHROTRON RADIATION, 24 (Pt 6), pp.1296-1298. https://doi.org/10.1107/S1600577517011961.
Access StatusOpen Access
The success of diffraction experiments from weakly scattering samples strongly depends on achieving an optimal signal-to-noise ratio. This is particularly important in single-particle imaging experiments where diffraction signals are typically very weak and the experiments are often accompanied by significant background scattering. A simple way to tremendously reduce background scattering by placing an aperture downstream of the sample has been developed and its application in a single-particle X-ray imaging experiment at FLASH is demonstrated. Using the concept of a post-sample aperture it was possible to reduce the background scattering levels by two orders of magnitude.
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