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    Post-sample aperture for low background diffraction experiments at X-ray free-electron lasers

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    Author
    Wiedorn, MO; Awel, S; Morgan, AJ; Barthelmess, M; Bean, R; Beyerlein, KR; Chavas, LMG; Eckerskorn, N; Fleckenstein, H; Heymann, M; ...
    Date
    2017-11-01
    Source Title
    Journal of Synchrotron Radiation
    Publisher
    INT UNION CRYSTALLOGRAPHY
    University of Melbourne Author/s
    Morgan, Andrew
    Affiliation
    School of Physics
    Metadata
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    Document Type
    Journal Article
    Citations
    Wiedorn, M. O., Awel, S., Morgan, A. J., Barthelmess, M., Bean, R., Beyerlein, K. R., Chavas, L. M. G., Eckerskorn, N., Fleckenstein, H., Heymann, M., Horke, D. A., Knoska, J., Mariani, V., Oberthuer, D., Roth, N., Yefanov, O., Barty, A., Bajt, S., Kuepper, J. ,... Chapman, H. N. (2017). Post-sample aperture for low background diffraction experiments at X-ray free-electron lasers. JOURNAL OF SYNCHROTRON RADIATION, 24 (Pt 6), pp.1296-1298. https://doi.org/10.1107/S1600577517011961.
    Access Status
    Open Access
    URI
    http://hdl.handle.net/11343/254974
    DOI
    10.1107/S1600577517011961
    Abstract
    The success of diffraction experiments from weakly scattering samples strongly depends on achieving an optimal signal-to-noise ratio. This is particularly important in single-particle imaging experiments where diffraction signals are typically very weak and the experiments are often accompanied by significant background scattering. A simple way to tremendously reduce background scattering by placing an aperture downstream of the sample has been developed and its application in a single-particle X-ray imaging experiment at FLASH is demonstrated. Using the concept of a post-sample aperture it was possible to reduce the background scattering levels by two orders of magnitude.

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