Show simple item record

dc.contributor.authorWiedorn, MO
dc.contributor.authorAwel, S
dc.contributor.authorMorgan, AJ
dc.contributor.authorBarthelmess, M
dc.contributor.authorBean, R
dc.contributor.authorBeyerlein, KR
dc.contributor.authorChavas, LMG
dc.contributor.authorEckerskorn, N
dc.contributor.authorFleckenstein, H
dc.contributor.authorHeymann, M
dc.contributor.authorHorke, DA
dc.contributor.authorKnoska, J
dc.contributor.authorMariani, V
dc.contributor.authorOberthuer, D
dc.contributor.authorRoth, N
dc.contributor.authorYefanov, O
dc.contributor.authorBarty, A
dc.contributor.authorBajt, S
dc.contributor.authorKuepper, J
dc.contributor.authorRode, AV
dc.contributor.authorKirian, RA
dc.contributor.authorChapman, HN
dc.date.accessioned2020-12-17T03:39:13Z
dc.date.available2020-12-17T03:39:13Z
dc.date.issued2017-11-01
dc.identifierpii: S1600577517011961
dc.identifier.citationWiedorn, M. O., Awel, S., Morgan, A. J., Barthelmess, M., Bean, R., Beyerlein, K. R., Chavas, L. M. G., Eckerskorn, N., Fleckenstein, H., Heymann, M., Horke, D. A., Knoska, J., Mariani, V., Oberthuer, D., Roth, N., Yefanov, O., Barty, A., Bajt, S., Kuepper, J. ,... Chapman, H. N. (2017). Post-sample aperture for low background diffraction experiments at X-ray free-electron lasers. JOURNAL OF SYNCHROTRON RADIATION, 24 (Pt 6), pp.1296-1298. https://doi.org/10.1107/S1600577517011961.
dc.identifier.issn1600-5775
dc.identifier.urihttp://hdl.handle.net/11343/254974
dc.description.abstractThe success of diffraction experiments from weakly scattering samples strongly depends on achieving an optimal signal-to-noise ratio. This is particularly important in single-particle imaging experiments where diffraction signals are typically very weak and the experiments are often accompanied by significant background scattering. A simple way to tremendously reduce background scattering by placing an aperture downstream of the sample has been developed and its application in a single-particle X-ray imaging experiment at FLASH is demonstrated. Using the concept of a post-sample aperture it was possible to reduce the background scattering levels by two orders of magnitude.
dc.languageEnglish
dc.publisherINT UNION CRYSTALLOGRAPHY
dc.titlePost-sample aperture for low background diffraction experiments at X-ray free-electron lasers
dc.typeJournal Article
dc.identifier.doi10.1107/S1600577517011961
melbourne.affiliation.departmentSchool of Physics
melbourne.source.titleJournal of Synchrotron Radiation
melbourne.source.volume24
melbourne.source.issuePt 6
melbourne.source.pages1296-1298
dc.rights.licenseCC BY
melbourne.elementsid1326200
melbourne.contributor.authorMorgan, Andrew
dc.identifier.eissn1600-5775
melbourne.accessrightsOpen Access


Files in this item

Thumbnail

This item appears in the following Collection(s)

Show simple item record