Post-sample aperture for low background diffraction experiments at X-ray free-electron lasers
dc.contributor.author | Wiedorn, MO | |
dc.contributor.author | Awel, S | |
dc.contributor.author | Morgan, AJ | |
dc.contributor.author | Barthelmess, M | |
dc.contributor.author | Bean, R | |
dc.contributor.author | Beyerlein, KR | |
dc.contributor.author | Chavas, LMG | |
dc.contributor.author | Eckerskorn, N | |
dc.contributor.author | Fleckenstein, H | |
dc.contributor.author | Heymann, M | |
dc.contributor.author | Horke, DA | |
dc.contributor.author | Knoska, J | |
dc.contributor.author | Mariani, V | |
dc.contributor.author | Oberthuer, D | |
dc.contributor.author | Roth, N | |
dc.contributor.author | Yefanov, O | |
dc.contributor.author | Barty, A | |
dc.contributor.author | Bajt, S | |
dc.contributor.author | Kuepper, J | |
dc.contributor.author | Rode, AV | |
dc.contributor.author | Kirian, RA | |
dc.contributor.author | Chapman, HN | |
dc.date.accessioned | 2020-12-17T03:39:13Z | |
dc.date.available | 2020-12-17T03:39:13Z | |
dc.date.issued | 2017-11-01 | |
dc.identifier | pii: S1600577517011961 | |
dc.identifier.citation | Wiedorn, M. O., Awel, S., Morgan, A. J., Barthelmess, M., Bean, R., Beyerlein, K. R., Chavas, L. M. G., Eckerskorn, N., Fleckenstein, H., Heymann, M., Horke, D. A., Knoska, J., Mariani, V., Oberthuer, D., Roth, N., Yefanov, O., Barty, A., Bajt, S., Kuepper, J. ,... Chapman, H. N. (2017). Post-sample aperture for low background diffraction experiments at X-ray free-electron lasers. JOURNAL OF SYNCHROTRON RADIATION, 24 (Pt 6), pp.1296-1298. https://doi.org/10.1107/S1600577517011961. | |
dc.identifier.issn | 1600-5775 | |
dc.identifier.uri | http://hdl.handle.net/11343/254974 | |
dc.description.abstract | The success of diffraction experiments from weakly scattering samples strongly depends on achieving an optimal signal-to-noise ratio. This is particularly important in single-particle imaging experiments where diffraction signals are typically very weak and the experiments are often accompanied by significant background scattering. A simple way to tremendously reduce background scattering by placing an aperture downstream of the sample has been developed and its application in a single-particle X-ray imaging experiment at FLASH is demonstrated. Using the concept of a post-sample aperture it was possible to reduce the background scattering levels by two orders of magnitude. | |
dc.language | English | |
dc.publisher | INT UNION CRYSTALLOGRAPHY | |
dc.title | Post-sample aperture for low background diffraction experiments at X-ray free-electron lasers | |
dc.type | Journal Article | |
dc.identifier.doi | 10.1107/S1600577517011961 | |
melbourne.affiliation.department | School of Physics | |
melbourne.source.title | Journal of Synchrotron Radiation | |
melbourne.source.volume | 24 | |
melbourne.source.issue | Pt 6 | |
melbourne.source.pages | 1296-1298 | |
dc.rights.license | CC BY | |
melbourne.elementsid | 1326200 | |
melbourne.contributor.author | Morgan, Andrew | |
dc.identifier.eissn | 1600-5775 | |
melbourne.accessrights | Open Access |