Atomic-resolution electron energy loss spectroscopy imaging in aberration corrected scanning transmission electron microscopy
Author
Allen, LJ; Findlay, SD; Lupini, AR; Oxley, MP; Pennycook, SJDate
2003-09-05Source Title
PHYSICAL REVIEW LETTERSPublisher
AMERICAN PHYSICAL SOCAffiliation
PhysicsMetadata
Show full item recordDocument Type
Journal ArticleCitations
Allen, L. J., Findlay, S. D., Lupini, A. R., Oxley, M. P. & Pennycook, S. J. (2003). Atomic-resolution electron energy loss spectroscopy imaging in aberration corrected scanning transmission electron microscopy. PHYSICAL REVIEW LETTERS, 91 (10), https://doi.org/10.1103/PhysRevLett.91.105503.Access Status
This item is currently not available from this repositoryDescription
C1 - Journal Articles Refereed
Abstract
The "delocalization" of inelastic scattering is an important issue for the ultimate spatial resolution of innershell spectroscopy in the electron microscope. It is demonstrated in a nonlocal model for electron energy loss spectroscopy (EELS) that delocalization of scanning transmission electron microscopy (STEM) images for single, isolated atoms is primarily determined by the width of the probe, even for light atoms. We present experimental data and theoretical simulations for Ti L-shell EELS in a [100] SrTiO3 crystal showing that, in this case, delocalization is not significantly increased by dynamical propagation. Issues relating to the use of aberration correctors in the STEM geometry are discussed.
Keywords
Theoretical Physics; Condensed Matter Physics - Structural Properties ; Physical SciencesExport Reference in RIS Format
Endnote
- Click on "Export Reference in RIS Format" and choose "open with... Endnote".
Refworks
- Click on "Export Reference in RIS Format". Login to Refworks, go to References => Import References