Atomic-resolution electron energy loss spectroscopy imaging in aberration corrected scanning transmission electron microscopy
AuthorAllen, LJ; Findlay, SD; Lupini, AR; Oxley, MP; Pennycook, SJ
Source TitlePHYSICAL REVIEW LETTERS
PublisherAMERICAN PHYSICAL SOC
Document TypeJournal Article
CitationsAllen, L. J., Findlay, S. D., Lupini, A. R., Oxley, M. P. & Pennycook, S. J. (2003). Atomic-resolution electron energy loss spectroscopy imaging in aberration corrected scanning transmission electron microscopy. PHYSICAL REVIEW LETTERS, 91 (10), https://doi.org/10.1103/PhysRevLett.91.105503.
Access StatusThis item is currently not available from this repository
C1 - Journal Articles Refereed
The "delocalization" of inelastic scattering is an important issue for the ultimate spatial resolution of innershell spectroscopy in the electron microscope. It is demonstrated in a nonlocal model for electron energy loss spectroscopy (EELS) that delocalization of scanning transmission electron microscopy (STEM) images for single, isolated atoms is primarily determined by the width of the probe, even for light atoms. We present experimental data and theoretical simulations for Ti L-shell EELS in a  SrTiO3 crystal showing that, in this case, delocalization is not significantly increased by dynamical propagation. Issues relating to the use of aberration correctors in the STEM geometry are discussed.
KeywordsTheoretical Physics; Condensed Matter Physics - Structural Properties ; Physical Sciences
- Click on "Export Reference in RIS Format" and choose "open with... Endnote".
- Click on "Export Reference in RIS Format". Login to Refworks, go to References => Import References