iVAT and aVAT: Enhanced Visual Analysis for Cluster Tendency Assessment

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    Author
    Wang, L; Nguyen, UTV; Bezdek, JC; Leckie, CA; Ramamohanarao, K
    Editor
    Zaki, MJ; Yu, JX; Ravindran, B; Pudi, V
    Date
    2010-01-01
    Source Title
    ADVANCES IN KNOWLEDGE DISCOVERY AND DATA MINING, PT I, PROCEEDINGS
    Publisher
    SPRINGER-VERLAG BERLIN
    University of Melbourne Author/s
    NGUYEN, UYEN; Bezdek, James; Leckie, Christopher; Kotagiri, Ramamohanarao
    Affiliation
    Computer Science and Software Engineering
    Metadata
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    Document Type
    Conference Paper
    Citations
    Wang, L., Nguyen, U. T. V., Bezdek, J. C., Leckie, C. A. & Ramamohanarao, K. (2010). iVAT and aVAT: Enhanced Visual Analysis for Cluster Tendency Assessment. Zaki, MJ (Ed.) Yu, JX (Ed.) Ravindran, B (Ed.) Pudi, V (Ed.) ADVANCES IN KNOWLEDGE DISCOVERY AND DATA MINING, PT I, PROCEEDINGS, 6118, (PART 1), pp.16-+. SPRINGER-VERLAG BERLIN. https://doi.org/10.1007/978-3-642-13657-3_5.
    Access Status
    This item is currently not available from this repository
    URI
    http://hdl.handle.net/11343/29355
    DOI
    10.1007/978-3-642-13657-3_5
    Keywords
    Artificial Intelligence and Image Processing

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