School of Physics
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(OPTICAL SOC AMER, 2015-04-20)The polarization dependence of the reflection, refraction, and diffraction of electromagnetic waves from materials is measured in applications that extend from small (e.g., ellipsometry of semiconductor chips) to large ...
(2020)In searches for new physics in high-energy physics, experimental analyses are primarily concerned with physical processes which are rare or hitherto unobserved. To claim a statistically significant discovery or exclusion ...
(AMER CHEMICAL SOC, 2018-12-01)The ability to optically trap nanoscale particles in a reliable and noninvasive manner is emerging as an important capability for nanoscience. Different techniques have been introduced, including plasmonic nanostructures. ...