Achromatic Elemental Mapping Beyond the Nanoscale in the Transmission Electron Microscope
AuthorUrban, KW; Mayer, J; Jinschek, JR; Neish, MJ; Lugg, NR; Allen, LJ
Source TitlePHYSICAL REVIEW LETTERS
PublisherAMER PHYSICAL SOC
Document TypeJournal Article
CitationsUrban, K. W., Mayer, J., Jinschek, J. R., Neish, M. J., Lugg, N. R. & Allen, L. J. (2013). Achromatic Elemental Mapping Beyond the Nanoscale in the Transmission Electron Microscope. PHYSICAL REVIEW LETTERS, 110 (18), https://doi.org/10.1103/PhysRevLett.110.185507.
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C1 - Journal Articles Refereed
Newly developed achromatic electron optics allows the use of wide energy windows and makes feasible energy-filtered transmission electron microscopy (EFTEM) at atomic resolution. In this Letter we present EFTEM images formed using electrons that have undergone a silicon L(2,3) core-shell energy loss, exhibiting a resolution in EFTEM of 1.35 Å. This permits elemental mapping beyond the nanoscale provided that quantum mechanical calculations from first principles are done in tandem with the experiment to understand the physical information encoded in the images.
KeywordsCondensed Matter Physics not elsewhere classified; Expanding Knowledge in the Physical Sciences
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