TY - JOUR AU - Wiedorn, MO AU - Awel, S AU - Morgan, AJ AU - Barthelmess, M AU - Bean, R AU - Beyerlein, KR AU - Chavas, LMG AU - Eckerskorn, N AU - Fleckenstein, H AU - Heymann, M AU - Horke, DA AU - Knoska, J AU - Mariani, V AU - Oberthuer, D AU - Roth, N AU - Yefanov, O AU - Barty, A AU - Bajt, S AU - Kuepper, J AU - Rode, AV AU - Kirian, RA AU - Chapman, HN Y2 - 2020/12/17 Y1 - 2017/11/01 SN - 1600-5775 UR - http://hdl.handle.net/11343/254974 AB - The success of diffraction experiments from weakly scattering samples strongly depends on achieving an optimal signal-to-noise ratio. This is particularly important in single-particle imaging experiments where diffraction signals are typically very weak and the experiments are often accompanied by significant background scattering. A simple way to tremendously reduce background scattering by placing an aperture downstream of the sample has been developed and its application in a single-particle X-ray imaging experiment at FLASH is demonstrated. Using the concept of a post-sample aperture it was possible to reduce the background scattering levels by two orders of magnitude. LA - English PB - INT UNION CRYSTALLOGRAPHY T1 - Post-sample aperture for low background diffraction experiments at X-ray free-electron lasers DO - 10.1107/S1600577517011961 IS - Journal of Synchrotron Radiation VL - 24 IS - Pt 6 SP - 1296-1298 L1 - /bitstream/handle/11343/254974/PMC5665296.pdf?sequence=1&isAllowed=y ER -