TY  - JOUR
AU  - Wiedorn, MO
AU  - Awel, S
AU  - Morgan, AJ
AU  - Barthelmess, M
AU  - Bean, R
AU  - Beyerlein, KR
AU  - Chavas, LMG
AU  - Eckerskorn, N
AU  - Fleckenstein, H
AU  - Heymann, M
AU  - Horke, DA
AU  - Knoska, J
AU  - Mariani, V
AU  - Oberthuer, D
AU  - Roth, N
AU  - Yefanov, O
AU  - Barty, A
AU  - Bajt, S
AU  - Kuepper, J
AU  - Rode, AV
AU  - Kirian, RA
AU  - Chapman, HN
Y2  - 2020/12/17
Y1  - 2017/11/01
SN  - 1600-5775
UR  - http://hdl.handle.net/11343/254974
AB  - The success of diffraction experiments from weakly scattering samples strongly depends on achieving an optimal signal-to-noise ratio. This is particularly important in single-particle imaging experiments where diffraction signals are typically very weak and the experiments are often accompanied by significant background scattering. A simple way to tremendously reduce background scattering by placing an aperture downstream of the sample has been developed and its application in a single-particle X-ray imaging experiment at FLASH is demonstrated. Using the concept of a post-sample aperture it was possible to reduce the background scattering levels by two orders of magnitude.
LA  - English
PB  - INT UNION CRYSTALLOGRAPHY
T1  - Post-sample aperture for low background diffraction experiments at X-ray free-electron lasers
DO  - 10.1107/S1600577517011961
IS  - Journal of Synchrotron Radiation
VL  - 24
IS  - Pt 6
SP  - 1296-1298
L1  - /bitstream/handle/11343/254974/PMC5665296.pdf?sequence=1&isAllowed=y
ER  -